Characterization and design for variability and reliability

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2008, Pages 341-346

  Nowka, Kevin ^a   Nassif, Sani ^a   Agarwal, Kanak ^a  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LAYOUT COMPLEXITIES; RANDOM EFFECTS;

INTEGRATED CIRCUITS; RANDOM PROCESSES;

DESIGN;

EID: 57849140667     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2008.4672092     Document Type: Conference Paper

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