Product-representative "at speed" test structures for CMOS characterization

IBM Journal of Research and Development

Volumn 50, Issue 4-5, 2006, Pages 451-468

  Ketchen, Mark B ^a   Bhushan, Manjul ^b  

^a IBM RESEARCH   (United States)

^b IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUSINESS MACHINES; DATA REDUCTION; DATA STRUCTURES; MICROPROCESSOR CHIPS; MOSFET DEVICES; SILICON ON INSULATOR TECHNOLOGY;

MODEL-TO-HARDWARE CORRELATION; PRODUCTION-REPRESENTATIVE TEST STRUCTURES; TRACKING PRODUCT PERFORMANCE;

CMOS INTEGRATED CIRCUITS;

EID: 33748566775     PISSN: 00188646     EISSN: 00188646     Source Type: Journal    
DOI: 10.1147/rd.504.0451     Document Type: Article

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