Data analysis techniques for CMOS technology characterization and product impact assessment

Proceedings - International Test Conference

Volumn , Issue , 2006, Pages

  Gattiker, Anne ^a   Bhushan, Manjul ^b   Ketchen, Mark B ^c  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

^b IBM   (United States)

^c IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PROCESSING; DATA REDUCTION; PRODUCT DEVELOPMENT; PROGRAM DEBUGGING;

INTUITIVE ASSIMILATION; PROCESS DEBUG;

CMOS INTEGRATED CIRCUITS;

EID: 39749188895     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2006.297743     Document Type: Conference Paper

References (8)