A test structure for characterizing local device mismatches

IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Volumn , Issue , 2006, Pages 67-68

  Agarwal, Kanak ^a   Liu, Frank ^a   McDowell, Chandler ^a   Nassif, Sani ^a   Nowka, Kevin ^a   Palmer, Meghann ^a   Acharyya, Dhruva ^a   Plusquellic, Jim ^a  

^a IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

THRESHOLD SCALING; VOLTAGE STATISTICS;

STATISTICAL TESTS; VOLTAGE CONTROL;

ELECTRONIC EQUIPMENT;

EID: 39749142750     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)