Surface damage induced by FIB milling and imaging of biological samples is controllable

Microscopy Research and Technique

Volumn 70, Issue 10, 2007, Pages 895-903

  Drobne, Damjana ^a   Milani, Marziale ^b   Lešer, Vladka ^a   Tatti, Francesco ^c  

^a UNIVERSITY OF LJUBLJANA   (Slovenia)

^b UNIVERSITY OF MILANO BICOCCA   (Italy)

^c Thermo Fisher Scientific   (United States)

Author keywords

Conductive staining; Digestive glands; Electron microscopy; FIB damage; FIB SEM; Terrestrial isopod

Indexed keywords

GALLIUM COMPOUNDS; ION BEAMS; IONS; MILLING (MACHINING);

BEAM DAMAGE; BIOLOGICAL SAMPLES; CONDUCTIVE STAINING; DIGESTIVE GLANDS; FOCUSED ION BEAM DAMAGE; FOCUSED ION BEAM/SEM; FOCUSED IONS BEAMS; GLAND CELLS; TERRESTRIAL ISOPODS;

SCANNING ELECTRON MICROSCOPY;

GALLIUM; NANOMATERIAL; PLATINUM;

ARTICLE; ARTIFACT; CELL SURFACE; EXOCRINE GLAND; FOCUSED ION BEAM; IMAGE ENHANCEMENT; IMAGE QUALITY; IMAGING; MORPHOLOGY; PRIORITY JOURNAL; RADIOACTIVE CONTAMINATION; SCANNING ELECTRON MICROSCOPE; SURFACE PROPERTY; TECHNIQUE; TISSUE SECTION; TISSUE STRUCTURE;

EID: 35148812949     PISSN: 1059910X     EISSN: 10970029     Source Type: Journal    
DOI: 10.1002/jemt.20494     Document Type: Article

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