Preparation of site-specific cross-sections of heterogeneous catalysts prepared by focused ion beam milling

Journal of Microscopy

Volumn 211, Issue 2, 2003, Pages 161-166

  Haswell, R ^a   McComb, D W ^b   Smith, W ^c  

^a SHELL RESEARCH AND TECHNOLOGY CENTRE   (Netherlands)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Cross sections; Focused ion beam milling; Heterogeneous catalysts; Transmission electron microscopy

Indexed keywords

CATALYSTS; GRINDING (MACHINING); HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IONS; MILLING (MACHINING);

CATALYST SYSTEM; CROSS-SECTION; FOCUSED ION BEAM MILLING; FOCUSED IONS BEAMS; HETEROGENEOUS CATALYST; NANOMETRES; ORIGINAL SAMPLE; SITE-SPECIFIC; SUBMICROMETER RESOLUTION; TRANSMISSION ELECTRON;

FOCUSED ION BEAMS;

ARTICLE; CATALYST; FOCUSED ION BEAM MILLING; IMAGING; MORPHOLOGY; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; TECHNIQUE; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAMICROTOMY;

EID: 0042659538     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2003.01216.x     Document Type: Article

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