Focused ion beam manipulation and ultramicroscopy of unprepared cells

Scanning

Volumn 28, Issue 3, 2006, Pages 148-154

  Milani, Marziale ^a   Drobne, Damjana ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

Electron microscopy; Focused ion beam; Sample preparation; Tomography; Ultramicroscopy; Yeast cell

Indexed keywords

COMMINUTION; IMAGING TECHNIQUES; ION BEAMS; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY; YEAST;

FOCUSED ION BEAM; SAMPLE PREPARATION; ULTRAMICROSCOPY; YEAST CELL;

CELLS;

ION;

ANIMAL CELL; ARTICLE; CELL ULTRASTRUCTURE; ELECTRON MICROSCOPY; HUMAN; HUMAN CELL; NONHUMAN; OOCYTE; PRIORITY JOURNAL; SACCHAROMYCES CEREVISIAE; SCANNING ELECTRON MICROSCOPY; YEAST CELL;

CELLS; SCANNING ELECTRON MICROSCOPY; YEASTS;

EID: 33746238150     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950280303     Document Type: Article

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