Using the FIB to characterize nanoparticle materials

Journal of Microscopy

Volumn 214, Issue 3, 2004, Pages 222-236

  Perrey, C R ^a   Carter, C B ^a   Michael, J R ^b   Kotula, P G ^b   Stach, E A ^c   Radmilovic, V R ^c  

^a University of Minnesota   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

FIB; Focused ion beam; Nanoparticle; Sample preparation; SEM; SiC; SiCN; TEM

Indexed keywords

FOCUSED ION BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOPARTICLES; NITROGEN COMPOUNDS; SILICON CARBIDE;

BULK COUNTERPART; FOCUSED IONS BEAMS; NANOPARTICLE MATERIALS; NANOPARTICLE STRUCTURES; NANOSCALE STRUCTURE; PROPERTY; SAMPLE PREPARATION; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; TEM;

SCANNING ELECTRON MICROSCOPY;

NANOPARTICLE;

CONFERENCE PAPER; FILM; FOCUSED ION BEAM MICROSCOPY; MICROSCOPY; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; STRUCTURE ACTIVITY RELATION; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 2942584930     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01325.x     Document Type: Conference Paper

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