SCOPUS 정보 검색 플랫폼

Volumn 60, Issue 2, 2006, Pages 206-209

TEM investigation of FIB induced damages in preparation of metal material TEM specimens by FIB

Author keywords

Crystallographic orientation; Damage; Focused ions beam; Transmission electron microscope

Indexed keywords

CRYSTAL ORIENTATION; ENERGY DISPERSIVE SPECTROSCOPY; GALLIUM; ION BEAMS; IRON; STEEL; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGRAPHIC ORIENTATION; DAMAGE; FOCUSED ION BEAM; TRANSMISSION ELECTRON MICROSCOPE;

METALS;

EID: 27644495241 PISSN: 0167577X EISSN: None Source Type: Journal
DOI: 10.1016/j.matlet.2005.08.018 Document Type: Article

Times cited : (71)

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