메뉴 건너뛰기




Volumn 26, Issue 43, 2015, Pages

High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: From traditional 2D and 3D imaging to correlative microscopy

Author keywords

correlative microscopy; high resolution; high sensitivity; imaging; ionisation; secondary ion mass spectrometry; sputtering

Indexed keywords

ELECTRIC FIELDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING TECHNIQUES; ION SOURCES; IONIZATION; MASS SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SECONDARY EMISSION; SPECTROMETRY; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84944348586     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/26/43/434001     Document Type: Article
Times cited : (82)

References (152)
  • 86
    • 84865546584 scopus 로고    scopus 로고
    • Pohlker C et al 2012 Science 337 1075
    • (2012) Science , vol.337 , pp. 1075
    • Pohlker, C.1
  • 88
    • 84877633252 scopus 로고    scopus 로고
    • Harris E et al 2013 Science 340 727
    • (2013) Science , vol.340 , pp. 727
    • Harris, E.1
  • 89
  • 102
    • 84944336230 scopus 로고    scopus 로고
    • Private communication
    • Hillion F 2010 Private communication
    • (2010)
    • Hillion, F.1
  • 104
    • 84944336231 scopus 로고    scopus 로고
    • Private communication
    • De Chambost E 2008 Private communication
    • (2008)
    • De Chambost, E.1
  • 122
    • 78650359235 scopus 로고    scopus 로고
    • University of Oxford
    • Ahmed S 2007 PhD Thesis University of Oxford
    • (2007) PhD Thesis
    • Ahmed, S.1
  • 124
    • 84892810038 scopus 로고    scopus 로고
    • Atomic force microscopy
    • vol (Berlin: Springer)
    • Frétigny C 2007 Atomic force microscopy Nanoscience vol 91 (Berlin: Springer)
    • (2007) Nanoscience , vol.91 , pp. 91
    • Frétigny, C.1
  • 134
    • 1442270634 scopus 로고    scopus 로고
    • Introduction to scanning tunneling microscopy
    • (Berlin: Springer)
    • Meyer E, Hug H and Bennewitz R 2004 Introduction to scanning tunneling microscopy Scanning Probe Microscopy 15 (Berlin: Springer)
    • (2004) Scanning Probe Microscopy , vol.15
    • Meyer, E.1    Hug, H.2    Bennewitz, R.3
  • 140
    • 84944336235 scopus 로고    scopus 로고
    • in preparation
    • Yedra L et al 2015 in preparation
    • (2015)
    • Yedra, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.