-
1
-
-
0003776074
-
Secondary ion mass spectrometry
-
John Wiley & Sons, New York
-
A. Benninghoven, F.G. Rüdenauer, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry. Basic Concepts, Instrumental Aspects, Applications and Trends, John Wiley & Sons, New York, 1987.
-
(1987)
Basic Concepts, Instrumental Aspects, Applications and Trends
-
-
Benninghoven, A.1
Rüdenauer, F.G.2
Werner, H.W.3
-
2
-
-
0012302182
-
Secondary ion mass spectrometry
-
John Wiley & Sons, New York
-
R.G. Wilson, F.A. Stevie, C.W. Magee (Eds.), Secondary Ion Mass Spectrometry. A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, John Wiley & Sons, New York, 1989.
-
(1989)
A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
-
-
Wilson, R.G.1
Stevie, F.A.2
Magee, C.W.3
-
4
-
-
0000915147
-
-
V.R. Deline, W. Katz, C.A. Evans Jr., P. Williams, Appl. Phys. Lett. 33 (1978) 832.
-
(1978)
Appl. Phys. Lett.
, vol.33
, pp. 832
-
-
Deline, V.R.1
Katz, W.2
Evans Jr., C.A.3
Williams, P.4
-
8
-
-
10044226825
-
-
V.I. Shvachko, B.T. Nadykto, Y.M. Fogel, B.M. Vasyutinskii, G.N. Kartmarzov, Soviet Phys. Solid State 7 (1966) 1572.
-
(1966)
Soviet Phys. Solid State
, vol.7
, pp. 1572
-
-
Shvachko, V.I.1
Nadykto, B.T.2
Fogel, Y.M.3
Vasyutinskii, B.M.4
Kartmarzov, G.N.5
-
18
-
-
0019548895
-
-
A.E. Morgan, H.A.M. de Grefte, N. Warmoltz, H.W. Werner, H.J. Tolle, Appl. Surf. Sci. 7 (1981) 372.
-
(1981)
Appl. Surf. Sci.
, vol.7
, pp. 372
-
-
Morgan, A.E.1
De Grefte, H.A.M.2
Warmoltz, N.3
Werner, H.W.4
Tolle, H.J.5
-
25
-
-
4243516176
-
-
W. De Coster, B. Brijs, P. Osiceanu, J. Alay, M. Caymax, W. Vandervorst, Nucl. Instrum. Meth. B 85 (1994) 911.
-
(1994)
Nucl. Instrum. Meth. B
, vol.85
, pp. 911
-
-
De Coster, W.1
Brijs, B.2
Osiceanu, P.3
Alay, J.4
Caymax, M.5
Vandervorst, W.6
-
26
-
-
0001302845
-
-
J.S. Williams, M. Petravic, B.G. Svensson, M. Conway, J. Appl. Phys. 76 (1994) 1840.
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 1840
-
-
Williams, J.S.1
Petravic, M.2
Svensson, B.G.3
Conway, M.4
-
29
-
-
0042030908
-
-
S. Tougaard, H.S. Hansen, M. Neumann, Surf. Sci. 244 (1991) 125; S. Tougaard, J. Vac. Sci. Technol. A 21 (2003) 1081.
-
(2003)
J. Vac. Sci. Technol. A
, vol.21
, pp. 1081
-
-
Tougaard, S.1
-
31
-
-
10044246765
-
-
T. Janssens, C. Huyghebaert, W. Vandervorst, A. Gildenpfennig, H. Brongersma, Appl. Surf. Sci. 203 (2003) 30.
-
(2003)
Appl. Surf. Sci.
, vol.203
, pp. 30
-
-
Janssens, T.1
Huyghebaert, C.2
Vandervorst, W.3
Gildenpfennig, A.4
Brongersma, H.5
-
35
-
-
2942575322
-
-
P. Williams, K.M. Stika, J.A. Davies, T.E. Jackman, Nucl. Instrum. Meth. 218 (1983) 299.
-
(1983)
Nucl. Instrum. Meth.
, vol.218
, pp. 299
-
-
Williams, P.1
Stika, K.M.2
Davies, J.A.3
Jackman, T.E.4
-
36
-
-
0009394101
-
Practical surface analysis
-
D. Briggs, M.P. Seah John Wiley & Sons, Chichester, Chapter 4
-
P. Williams, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, Ion and Neutral Spectroscopy, vol. 2, John Wiley & Sons, Chichester, 1992, p. 177, Chapter 4.
-
(1992)
Ion and Neutral Spectroscopy
, vol.2
, pp. 177
-
-
Williams, P.1
-
38
-
-
10044278811
-
-
Ion implantation was made by Leonard Kroko Inc., Tustin, California
-
Ion implantation was made by Leonard Kroko Inc., Tustin, California.
-
-
-
-
39
-
-
10044279996
-
-
The reference standard was provided by C.W. Magee; p. 3.2-7 in Ref. [2]
-
The reference standard was provided by C.W. Magee; p. 3.2-7 in Ref. [2].
-
-
-
-
40
-
-
0347033753
-
-
A. Benninghoven, B. Hagenhoff, H.W. Werner John Wiley & Sons, Chichester UK
-
C. Tian, K. Elst, W. Vandervorst, K. Maex, in: A. Benninghoven, B. Hagenhoff, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS X, John Wiley & Sons, Chichester UK, 1997, p. 203.
-
(1997)
Secondary Ion Mass Spectrometry SIMS
, vol.10
, pp. 203
-
-
Tian, C.1
Elst, K.2
Vandervorst, W.3
Maex, K.4
-
42
-
-
0000499876
-
-
K. Wittmaack, Nucl. Instrum. Meth. B 2 (1984) 674; K. Wittmaack, Surf. Sci. 90 (1979) 557.
-
(1979)
Surf. Sci.
, vol.90
, pp. 557
-
-
Wittmaack, K.1
-
48
-
-
0032114768
-
-
K. Franzreb, A. Pratt, S. Splinter, P. van der Heide, Surf. Interface Anal. 26 (1998) 597.
-
(1998)
Surf. Interface Anal.
, vol.26
, pp. 597
-
-
Franzreb, K.1
Pratt, A.2
Splinter, S.3
Van Der Heide, P.4
-
52
-
-
0004681486
-
-
M.F. Dumke, T.A. Tombrello, R.A. Weller, R.M. Housley, E.H. Cirlin, Surf. Sc. 124 (1983) 407.
-
(1983)
Surf. Sc.
, vol.124
, pp. 407
-
-
Dumke, M.F.1
Tombrello, T.A.2
Weller, R.A.3
Housley, R.M.4
Cirlin, E.H.5
-
54
-
-
10044276481
-
-
personal communication
-
A.T.S. Wee, personal communication, 2004.
-
(2004)
-
-
Wee, A.T.S.1
-
55
-
-
10044270487
-
-
P.J. Martin, A.R. Bayly, R.J. Macdonald, N.H. Tolk, G.J. Clark, J.C. Kelly, Surf. Sci. 60 (1976) 349.
-
(1976)
Surf. Sci.
, vol.60
, pp. 349
-
-
Martin, P.J.1
Bayly, A.R.2
Macdonald, R.J.3
Tolk, N.H.4
Clark, G.J.5
Kelly, J.C.6
-
68
-
-
0035341008
-
-
J.J. Serrano, H. De Witte, W. Vandervorst, B. Guzman, J.M. Blanco, J. Appl. Phys. 89 (2001) 5191.
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 5191
-
-
Serrano, J.J.1
De Witte, H.2
Vandervorst, W.3
Guzman, B.4
Blanco, J.M.5
-
69
-
-
10044271633
-
-
A. Benninghoven et al. (Eds.), Elsevier, Amsterdam
-
J. Vlekken, D. Polus, M. D'OIieslaeger, W. Vandervorst, L. De Schepper, in: A. Benninghoven et al. (Eds.), Proceedings of SIMS XII, Elsevier, Amsterdam, 2000, p. 341.
-
(2000)
Proceedings of SIMS
, vol.12
, pp. 341
-
-
Vlekken, J.1
Polus, D.2
D'Oiieslaeger, M.3
Vandervorst, W.4
De Schepper, L.5
-
70
-
-
1242284702
-
-
K. Kajihara, L. Skuja, M. Hirano, H. Hosono, Phys. Rev. Lett. 92 (2004) 15504.
-
(2004)
Phys. Rev. Lett.
, vol.92
, pp. 15504
-
-
Kajihara, K.1
Skuja, L.2
Hirano, M.3
Hosono, H.4
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