Useful yields of MCsx+ clusters: A cesium concentration-dependent study on the Cation Mass Spectrometer (CMS)

International Journal of Mass Spectrometry

Volumn 225, Issue 2, 2003, Pages 135-153

  Wirtz, T ^a   Migeon, H N ^a   Scherrer, H ^b  

^a LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

^b INSTITUT JEAN LAMOUR   (France)

Author keywords

Cesium clusters; Cesium concentration; Ionization probability; Quantification; Secondary Ion Mass Spectrometry; Useful yield; Work function shifts

Indexed keywords

ALUMINUM; CESIUM; GALLIUM; NICKEL; SILICON;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CONCENTRATION (PARAMETERS); IONIZATION; MASS SPECTROMETER; MASS SPECTROMETRY; QUANTITATIVE ANALYSIS;

EID: 0037441248     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1387-3806(02)01088-6     Document Type: Article

References (34)

1. Storms H.A., Brown K.F., Stein J.D. Anal. Chem. 49:1977;2023.
2. Gao Y. J. Appl. Phys. 64:1988;3760.
3. Gnaser H., Oechsner H. Fresenius J. Anal. Chem. 341:1991;54.
4. Wittmaack K. Nucl. Instrum. Methods Phys. Res. B. 64:1992;621.
5. Magee C.W., Harrington W.L., Botnick E.M. Int. J. Mass Spectrom. Ion Process. 103:1990;45.
6. Ray M.A., Baker J.E., Loxton C.M., Greene J.E. J. Vac. Sci. Technol. A. 6(1):1988;44.
7. Y. Gao, Y. Marie, F. Saldi, H.-N. Migeon, in: A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS IX, Wiley, Chichester, 1994, p. 382.
8. Y. Gao, Y. Marie, F. Saldi, H.-N. Migeon, in: A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS IX, Wiley, Chichester, 1994, p. 406.
9. Mootz T., Adams F. Int. J. Mass Spectrom. Ion Process. 152:1996;209.
10. Yu M.L., Lang N.D. Phys. Rev. Lett. 50(2):1983;127.
11. Yu M.L. Phys. Rev. B. 29(4):1984;2311.
12. Marie Y., Gao Y., Saldi F., Migeon H.-N. Surf. Interface Anal. 23:1995;38.
13. Kan T., Mitsukawa K., Ueyama T., Takada M., Yasue T., Koshikawa T. J. Surf. Anal. 5:1999;52.
14. Wittmaack K. Nucl. Instrum. Methods Phys. Res. B. 85:1994;374.
15. T. Mootz, B. Rasser, P. Sudraud, E. Niehuis, T. Wirtz, W. Bieck, H.-N. Migeon, in: A. Benninghoven, P. Bertrand, H.-N. Migeon, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS XII, Elsevier, Amsterdam, 2000, p. 233.
16. Wirtz T., Duez B., Migeon H.-N., Scherrer H. Int. J. Mass Spectrom. 209:2001;57.
17. D.A. Dahl, SIMION 3D, Version 6.0.
18. Michaelson H.B. J. Appl. Phys. 48:1977;4729.
19. H.H. Andersen, H.L. Bay, in: R. Behrisch (Ed.), Sputtering by Particle Bombardment I, Springer, Berlin, 1981, p. 145.
20. Schulz F., Wittmaack K. Radiat. Eff. 29:1976;31.
21. K. Wittmaack, in: A. Benninghoven, K.T.F. Janssen, J. Tümpner, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS VIII, Wiley, Chichester, 1992, p. 91.
22. Chelgren J.E., Katz W., Deline V.R., Evans C.A., Blattner R.J., Williams P. J. Vac. Sci. Technol. 16:1979;324.
23. Mootz T., Adriaens A., Adams F. Int. J. Mass Spectrom. Ion Process. 156:1996;1.
24. Y. Marie, Doctoral Thesis, Institut National Polytechnique de Lorraine, 1995.
25. Nørskov J.K., Lundqvist B.I. Phys. Rev. B. 19(11):1979;5661.
26. Lang N.D. Phys. Rev. B. 27(4):1983;2019.
27. Gnaser H. Phys. Rev. B. 54(23):1996;17141.
28. Bernheim M., Le Bourse F. Nucl. Instrum. Methods Phys. Res. B. 27:1987;94.
29. M. Bernheim, G. Slodzian, in: A. Benninghoven, A.M. Huber, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS VI, Wiley, Chichester, 1988, p. 139.
30. Hohlfeld A., Sunjic M., Horn K. J. Vac. Sci. Technol. A. 5:1987;679.
31. Ortega J.E., Oellig E.M., Ferron J., Miranda R. Phys. Rev. B. 36:1989;6213.
32. Gerlach R.L., Rhodin T.N. Surf. Sci. 19:1970;403.
33. H.-N. Migeon, C. Le Pipec, J.J. Le Goux, in: A. Benninghoven, R.J. Colton, D.S. Simons, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS V, Springer, Berlin, 1986, p. 155.
34. W. Bieck, B. Rasser, M. Schuhmacher, P. Sudraud, H.-N. Migeon, in: A. Benninghoven, B. Hagenhoff, H.W. Werner (Eds.), Secondary Ion Mass Spectrometry SIMS X, Wiley, Chichester, 1997, p. 975.