Exploring the design space for crossbar arrays built with mixed-ionic-electronic-conduction (MIEC) access devices

IEEE Journal of the Electron Devices Society

Volumn 3, Issue 5, 2015, Pages 423-434

  Narayanan, Pritish ^a   Burr, Geoffrey W ^a   Shenoy, Rohit S ^b   Stephens, Samantha ^c   Virwani, Kumar ^a   Padilla, Alvaro ^d   Kurdi, Bulent N ^a   Gopalakrishnan, Kailash ^e  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b INTEL CORPORATION   (United States)

^c WELLESLEY COLLEGE   (United States)

^d SanDisk Corporation   (United States)

^e IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

1AD1R; 1S1R; access device; circuit simulation; crossbar memory; MIEC; non volatile memory; selector

Indexed keywords

CIRCUIT SIMULATION; DATA STORAGE EQUIPMENT; DIGITAL STORAGE; ELECTRIC RESISTANCE; NONVOLATILE STORAGE;

1AD1R; 1S1R; ACCESS DEVICES; CROSS-BAR MEMORY; MIEC; NON-VOLATILE MEMORY; SELECTOR;

SPICE;

EID: 84940100512     PISSN: None     EISSN: 21686734     Source Type: Journal    
DOI: 10.1109/JEDS.2015.2442242     Document Type: Article

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