A comprehensive crossbar array model with solutions for line resistance and nonlinear device characteristics

IEEE Transactions on Electron Devices

Volumn 60, Issue 4, 2013, Pages 1318-1326

  Chen, An ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

Crossbar array; line resistance; memory; nonlinearity; select devices

Indexed keywords

ACCURATE ANALYSIS; CROSSBAR ARRAYS; CURRENT DEGRADATION; LINE RESISTANCE; NON-LINEAR DEVICES; QUANTITATIVE TOOL; SELECT DEVICES; VOLTAGE WINDOW;

CONTROL NONLINEARITIES; DATA STORAGE EQUIPMENT; ELECTRON DEVICES;

ELECTRONICS ENGINEERING;

EID: 84875485846     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2013.2246791     Document Type: Article

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