Effect of wordline/bitline scaling on the performance, energy consumption, and reliability of cross-point memory array

ACM Journal on Emerging Technologies in Computing Systems

Volumn 9, Issue 1, 2013, Pages

  Liang, Jiale ^a   Yeh, Stanley ^a   Simon Wong, S ^a   Philip Wong, H S ^a  

^a Stanford University   (United States)

Author keywords

Design; Performance; Reliability

Indexed keywords

CROSS-POINT MEMORY; DESIGN METHODOLOGY; GRAIN BOUNDARY SCATTERING; LARGE CURRENT DENSITY; MINIMUM FEATURE SIZES; PERFORMANCE; RESISTANCE VALUES; STRICT CONSTRAINT;

DESIGN; ENERGY DISSIPATION; ENERGY UTILIZATION; GRAIN BOUNDARIES; RELIABILITY; SURFACE SCATTERING;

WIRE;

EID: 84874861265     PISSN: 15504832     EISSN: 15504840     Source Type: Journal    
DOI: 10.1145/2422094.2422103     Document Type: Conference Paper

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