Large-scale (512kbit) integration of multilayer-ready access-devices based on Mixed-Ionic-Electronic-Conduction (MIEC) at 100% yield

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2012, Pages 41-42

  Burr, G W ^a   Virwani, K ^a   Shenoy, R S ^a   Padilla, A ^a   BrightSky, M ^b   Joseph, E A ^b   Lofaro, M ^b   Kellock, A J ^a   King, R S ^a   Nguyen, K ^a   Bowers, A N ^a   Jurich, M ^a   Rettner, C T ^a   Jackson, B ^a   Bethune, D S ^a   Shelby, R M ^a   Topuria, T ^a   Arellano, N ^a   Rice, P M ^a   Kurdi, B N ^a   Gopalakrishnan, K ^a   more..

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Access device; MIEC; MRAM; NVM; PCM; RRAM

Indexed keywords

ACCESS DEVICES; MIEC; MRAM; NVM; RRAM;

PULSE CODE MODULATION;

EID: 84866552361     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2012.6242451     Document Type: Conference Paper

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