Accessibility of nano-crossbar arrays of resistive switching devices

Proceedings of the IEEE Conference on Nanotechnology

Volumn , Issue , 2011, Pages 1767-1771

  Chen, An ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

crossbar array; nonlinearity; resistive switching devices; sensing margin

Indexed keywords

ACCESS RESISTANCE; ANALYTICAL APPROACH; BITLINES; CROSSBAR ARRAYS; LINE VOLTAGE; NON-LINEARITY; POWER EFFICIENCY; RESISTIVE SWITCHING; RESISTIVE SWITCHING DEVICES; SENSING MARGIN; STATISTICAL SIMULATION; SWITCHING DEVICES; WORDLINES;

NANOTECHNOLOGY;

SWITCHING SYSTEMS;

EID: 84858976459     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2011.6144367     Document Type: Conference Paper

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