Dynamic 'hour glass' model for SET and RESET in HfO 2 RRAM

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2012, Pages 75-76

  Degraeve, R ^a   Fantini, A ^a   Clima, S ^a   Govoreanu, B ^a   Goux, L ^a   Chen, Y Y ^a,b   Wouters, D J ^a,b   Roussel, Ph ^a   Kar, G S ^a   Pourtois, G ^a   Cosemans, S ^a   Kittl, J A ^a   Groeseneken, G ^a,b   Jurczak, M ^a   Altimime, L ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATORS; DYNAMIC EQUILIBRIA; FORMING CONDITIONS; GLASS MODELS; ION MOBILITY;

CIRCUIT SIMULATION; HAFNIUM OXIDES;

GLASS;

EID: 84866561026     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2012.6242468     Document Type: Conference Paper

References (8)

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4. B. Govoreanu et al., IEDM 2011.
5. R. Degraeve et al, IEDM 2010
6. E. Miranda, APL 92 (2008).
7. R. Degraeve et al, to be presented at VLSI-TSA 2012.
8. D. Ielmini et al., IEDM 2011.