Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system

Physica Status Solidi (B) Basic Research

Volumn 252, Issue 8, 2015, Pages 1700-1710

  Viezbicke, Brian D ^a   Patel, Shane ^a   Davis, Benjamin E ^a   Birnie, Dunbar P ^a  

^a Piscataway   (United States)

Author keywords

Band gaps; Near edge absorptivity ratio; Optical absorption; Polycrystalline semiconductors; Tauc plots; Thin films; ZnO

Indexed keywords

AMORPHOUS SEMICONDUCTORS; ENERGY GAP; II-VI SEMICONDUCTORS; LIGHT ABSORPTION; MAGNETIC SEMICONDUCTORS; NANOCRYSTALLINE MATERIALS; OXIDE MINERALS; POPULATION STATISTICS; SEMICONDUCTING ZINC COMPOUNDS; WIDE BAND GAP SEMICONDUCTORS; ZINC OXIDE;

ABSORPTIVITIES; ELECTRONIC TRANSITION; EXPERIMENTAL FACTORS; OPTICAL ABSORPTION EDGE; POLY-CRYSTALLINE SEMICONDUCTORS; SINGLE-CRYSTALLINE MATERIALS; TAUC PLOTS; UV-VIS ABSORPTIONS;

THIN FILMS;

EID: 84938526316     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201552007     Document Type: Article

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