Structural and optical characterization of ZnO nanocrystalline films deposited by sputtering

Optical Materials

Volumn 29, Issue 8, 2007, Pages 995-998

  Chawla, Amit Kumar ^a   Kaur, Davinder ^a   Chandra, Ramesh ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY ROORKEE   (India)

Author keywords

dc Magnetron sputtering; SEM; XRD; ZnO thin films

Indexed keywords

MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PARTIAL PRESSURE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

DC MAGNETRON SPUTTERING; OPTICAL CHARACTERIZATION; POWDER TARGETS;

OPTICAL FILMS;

EID: 33846851967     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2006.02.020     Document Type: Article

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