Optical and structural characteristics of ZnO thin films grown by rf magnetron sputtering

Materials Research Bulletin

Volumn 43, Issue 2, 2008, Pages 244-250

  Mandal, S ^a   Singha, R K ^a   Dhar, A ^a   Ray, S K ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

A. Semiconductor; A. Thin films; B. Sputtering; D. Optical properties

Indexed keywords

MAGNETRON SPUTTERING; MOLECULAR STRUCTURE; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION; ZINC OXIDE;

BAND EDGE EMISSIONS; ELECTRONIC TRANSITIONS; STRUCTURAL CHARACTERISTICS; ULTRAVIOLET ABSORPTION EDGES;

THIN FILMS;

EID: 37349051169     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2007.05.006     Document Type: Article

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