Growth and characterization of thin ZnO films deposited on glass substrates by electrodeposition technique

Applied Surface Science

Volumn 256, Issue 13, 2010, Pages 4114-4120

  Mouet, T ^a,b   Devers, T ^a   Telia, A ^b   Messai, Z ^a   Harel, V ^a   Konstantinov, K ^c   Kante, I ^d   Ta, M T ^a  

^a UNIVERSITÉ D'ORLÉANS   (France)

^b Universite Mentouri Constantine   (Algeria)

^c UNIVERSITY OF WOLLONGONG   (Australia)

^d UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

Author keywords

Dendritic deposits; Electrodeposition; Nanostructure; Thin film; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; ELECTRODEPOSITION; ELECTRODES; ELECTROLYTES; GLASS; II-VI SEMICONDUCTORS; METALLIC FILMS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY; SOLUTIONS; SUBSTRATES; THERMOOXIDATION; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

CHARACTERIZATION TECHNIQUES; ELECTRODEPOSITION TECHNIQUE; ELECTROLYTE CONCENTRATION; INSULATING SUBSTRATES; STRUCTURAL MORPHOLOGY; UV/VIS SPECTROPHOTOMETRY; VISIBLE WAVELENGTHS; X-RAYS DIFFRACTION;

OXIDE FILMS;

EID: 77950518738     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.01.093     Document Type: Article

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