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Volumn 33, Issue 3, 2010, Pages 209-214
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Investigation of annealing-treatment on structural and optical properties of sol-gel-derived zinc oxide thin films
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Author keywords
Optical bandgap; Optical constants; SE spectra; ZnO films
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Indexed keywords
ANNEALING TEMPERATURES;
ANNEALING TREATMENTS;
DIFFRACTOGRAMS;
EXTINCTION COEFFICIENTS;
HEXAGONAL WURTZITE;
OPTICAL BAND GAP ENERGY;
OPTICAL QUALITIES;
RANDOM ORIENTATIONS;
SE SPECTRA;
SI (100) SUBSTRATE;
SOL-GEL METHODS;
STRUCTURAL AND OPTICAL PROPERTIES;
THICKNESS OF THE FILM;
UV-VISIBLE;
XRD MEASUREMENTS;
ZINC OXIDE THIN FILMS;
ZNO FILMS;
ZNO THIN FILM;
ANNEALING;
CRYSTALLITE SIZE;
ENERGY GAP;
GELS;
METALLIC FILMS;
OPTICAL BAND GAPS;
OPTICAL CONSTANTS;
OXIDE FILMS;
REFRACTIVE INDEX;
SEMICONDUCTING SILICON COMPOUNDS;
SOL-GEL PROCESS;
SOL-GELS;
SOLS;
SPECTROSCOPIC ELLIPSOMETRY;
THIN FILMS;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
ZINC OXIDE;
ZINC SULFIDE;
OPTICAL FILMS;
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EID: 77957564598
PISSN: 02504707
EISSN: None
Source Type: Journal
DOI: 10.1007/s12034-010-0032-x Document Type: Article |
Times cited : (44)
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References (24)
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