Seeing and measuring in 3D with electrons

Comptes Rendus Physique

Volumn 15, Issue 2-3, 2014, Pages 140-150

  Bals, Sara ^a   Goris, Bart ^a   Altantzis, Thomas ^a   Heidari, Hamed ^a   Van Aert, Sandra ^a   Van Tendeloo, Gustaaf ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Atomic resolution; Electron tomography; Nanostructures; Three dimensional reconstruction

Indexed keywords

EID: 84897658289     PISSN: 16310705     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.crhy.2013.09.015     Document Type: Short Survey

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