Correction of non-linear thickness effects in HAADF STEM electron tomography

Ultramicroscopy

Volumn 116, Issue , 2012, Pages 8-12

  Van den Broek, W ^a   Rosenauer, A ^b   Goris, B ^a   Martinez, G T ^a   Bals, S ^a   Van Aert, S ^a   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF BREMEN   (Germany)

Author keywords

Cupping artifact; Frozen phonon simulations; HAADF STEM tomography; Quantitative HAADF STEM

Indexed keywords

CUPPING ARTIFACTS; ELECTRON TOMOGRAPHY; FROZEN PHONON SIMULATIONS; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; NANO-METER SCALE; NONLINEAR DAMPING; NONLINEAR EFFECT; THICKNESS EFFECT;

TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC IMPEDANCE TOMOGRAPHY;

ARTICLE; ARTIFACT; ATTENUATION; CONTROLLED STUDY; CORRELATION FUNCTION; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE DISPLAY; IMAGE RECONSTRUCTION; IMAGE RETRIEVAL; MATHEMATICAL MODEL; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; THICKNESS;

EID: 84859882991     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.03.005     Document Type: Article

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