A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy

Ultramicroscopy

Volumn 110, Issue 5, 2010, Pages 548-554

  Van den Broek, W ^a   Van Aert, S ^a   Van Dyck, D ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Algebraic reconstruction technique; Atomic resolution tomography; Depth sectioning; HAADF STEM

Indexed keywords

ALGEBRAIC RECONSTRUCTION TECHNIQUES; ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; ATOMIC LEVELS; ATOMIC POSITIONS; ATOMIC RESOLUTION; ATOMIC RESOLUTION TOMOGRAPHY; ATOMIC SCALE; DEPTH RESOLUTION; DIMENSIONAL CHARACTERIZATION; HAADF-STEM; MODEL BASED RECONSTRUCTION; OPENING ANGLE; PRIOR KNOWLEDGE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONS; TOMOGRAPHIC RECONSTRUCTION;

ALGEBRA; ELECTRIC FIELD MEASUREMENT; REPAIR; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

ALGORITHM; ARTICLE; IMAGE DISPLAY; IMAGE RECONSTRUCTION; MATHEMATICAL MODEL; OPTICAL RESOLUTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 77952320167     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.09.008     Document Type: Article

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