Catastrophic failure and fault-tolerant design of IGBT power electronic converters - An overview

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2013, Pages 507-513

  Wu, Rui ^a   Blaabjerg, Frede ^a   Wang, Huai ^a   Liserre, Marco ^a   Iannuzzo, Francesco ^b  

^a AALBORG UNIVERSITY   (Denmark)

^b UNIVERSITY OF CASSINO AND SOUTHERN LAZIO   (Italy)

Author keywords

catastrophic failure; fault torlerant circuit; Insulated Gate Bipolar Transistor; power electronics

Indexed keywords

CATASTROPHIC FAILURES; FAILURE BEHAVIORS; FAILURE MECHANISM; FAULT-TOLERANT DESIGNS; LIFETIME PREDICTION; POWER ELECTRONIC CONVERTERS; SCHEDULED MAINTENANCE; WEAR-OUT FAILURE;

CONDITION MONITORING; INDUSTRIAL ELECTRONICS; POWER CONVERTERS; POWER ELECTRONICS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

EID: 84893575169     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2013.6699187     Document Type: Conference Paper

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