-
1
-
-
34548696868
-
Revisiting power cycling test for better lifetime prediction in traction
-
M. Mermet-Guyennet, X. Perpiñá, M. Piton: "Revisiting power cycling test for better lifetime prediction in traction", Microelectronics Reliability, Vol. 47, pp. 1690-1695, 2007.
-
(2007)
Microelectronics Reliability
, vol.47
, pp. 1690-1695
-
-
Mermet-Guyennet, M.1
Perpiñá, X.2
Piton, M.3
-
2
-
-
0036540853
-
Selected failure mechanisms of modern power modules
-
M. Ciappa: "Selected failure mechanisms of modern power modules", Microelectronics Reliability, Vol. 42, no 4-5, pp. 653-667, 2002.
-
(2002)
Microelectronics Reliability
, vol.42
, Issue.4-5
, pp. 653-667
-
-
Ciappa, M.1
-
3
-
-
34548677751
-
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities
-
X. Perpiñà, A. Castellazzi, M. Piton, M. Mermet-Guyennet, J. Millán: "Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities", Microelectronics Reliability, Vol. 47, pp. 1784-1785, 2007.
-
(2007)
Microelectronics Reliability
, vol.47
, pp. 1784-1785
-
-
Perpiñà, X.1
Castellazzi, A.2
Piton, M.3
Mermet-Guyennet, M.4
Millán, J.5
-
4
-
-
0027838254
-
Second breakdown and latch-up behavior of IGBT's
-
Brighton, UK, September, pp
-
K. Heumann, M. Quenum: "Second breakdown and latch-up behavior of IGBT's", in Proc. 5th European Power Electronics (EPE) Conf. Rec. 1993, Brighton, UK, Vol. 4, September, pp 301-305.
-
(1993)
Proc. 5th European Power Electronics (EPE) Conf. Rec
, vol.4
, pp. 301-305
-
-
Heumann, K.1
Quenum, M.2
-
5
-
-
72949084951
-
A discussion of some known physical models for second breakdown
-
F. Weitzsch: "A discussion of some known physical models for second breakdown", IEEE transactions on electron devices, Vol. 13, no 11, pp. 731-734, 1966.
-
(1966)
IEEE transactions on electron devices
, vol.13
, Issue.11
, pp. 731-734
-
-
Weitzsch, F.1
-
6
-
-
0003277507
-
Current mode second breakdown in epitaxial planar transistors
-
H. B. Grutchfield, T. J. Moutoux: "Current mode second breakdown in epitaxial planar transistors", IEEE Transactions on Electron Devices, Vol. 13, no 11, pp. 743-748, 1966.
-
(1966)
IEEE Transactions on Electron Devices
, vol.13
, Issue.11
, pp. 743-748
-
-
Grutchfield, H.B.1
Moutoux, T.J.2
-
7
-
-
11544327960
-
Thermal breakdown in silicon p-n junction devices
-
B. S. Khurana, T. Sugano: "Thermal breakdown in silicon p-n junction devices", IEEE Transactions on Electron Devices, Vol. 13, no 11, pp. 763-770, 1966.
-
(1966)
IEEE Transactions on Electron Devices
, vol.13
, Issue.11
, pp. 763-770
-
-
Khurana, B.S.1
Sugano, T.2
-
8
-
-
0016652448
-
+ structure
-
+ structure", Japanese Journal of Applied Physics, Vol. 14, no 12, pp. 1961-1968, 1975.
-
(1975)
Japanese Journal of Applied Physics
, vol.14
, Issue.12
, pp. 1961-1968
-
-
Hane, K.1
Suzuki, T.2
-
10
-
-
0032678240
-
Dynamic Avalanche in 3.3-kV Si Power Diodes
-
M. Domeij, B. Breitholtz, L. M. Hillkirk, J. Linnros, M. Östling: "Dynamic Avalanche in 3.3-kV Si Power Diodes", IEEE transactions on Electron Devices, Vol. 46, no 4, pp. 529-536, 1999.
-
(1999)
IEEE transactions on Electron Devices
, vol.46
, Issue.4
, pp. 529-536
-
-
Domeij, M.1
Breitholtz, B.2
Hillkirk, L.M.3
Linnros, J.4
Östling, M.5
-
11
-
-
0026168678
-
Analytical model for the destruction mechanism of GTO-like devices by avalanche injection
-
G. K. Wachutka: "Analytical model for the destruction mechanism of GTO-like devices by avalanche injection" IEEE Transactions on Electron Devices, Vol. 38, no. 6, pp. 1516-1523, 1991.
-
(1991)
IEEE Transactions on Electron Devices
, vol.38
, Issue.6
, pp. 1516-1523
-
-
Wachutka, G.K.1
-
12
-
-
0038732707
-
On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche
-
M. Domeij, J. Lutz, D. Silber: "On the destruction limit of Si power diodes during reverse recovery with dynamic avalanche", IEEE Transactions on Electron Devices, Vol. 50, no. 2, pp. 486-493, 2003.
-
(2003)
IEEE Transactions on Electron Devices
, vol.50
, Issue.2
, pp. 486-493
-
-
Domeij, M.1
Lutz, J.2
Silber, D.3
-
13
-
-
0033640299
-
Current filamentation in bipolar power devices during dynamic avalanche breakdown
-
J. Oetjen, R. Jungblut, U. Kuhlmann, J. Arkenau, R. Sitting: "Current filamentation in bipolar power devices during dynamic avalanche breakdown", Solid-State Electronics, Vol. 44, pp. 117-123, 2000.
-
(2000)
Solid-State Electronics
, vol.44
, pp. 117-123
-
-
Oetjen, J.1
Jungblut, R.2
Kuhlmann, U.3
Arkenau, J.4
Sitting, R.5
-
14
-
-
0000245547
-
Avalanche characteristics and failure mechanism of high voltage diodes
-
H. Egawa: "Avalanche characteristics and failure mechanism of high voltage diodes", IEEE Transactions on Electron Devices, Vol. 13, no. 11, pp. 754-758, 1966.
-
(1966)
IEEE Transactions on Electron Devices
, vol.13
, Issue.11
, pp. 754-758
-
-
Egawa, H.1
-
15
-
-
0032777935
-
Failure mechanisms of IGBT's under short-circuit and clamped inductive switching stress
-
M. Trivedi, K. Shenai: "Failure mechanisms of IGBT's under short-circuit and clamped inductive switching stress", IEEE Transactions on Power Electronics, Vol. 14, no 1, pp. 108-116, 1999.
-
(1999)
IEEE Transactions on Power Electronics
, vol.14
, Issue.1
, pp. 108-116
-
-
Trivedi, M.1
Shenai, K.2
-
16
-
-
0033877923
-
Failure dynamics of the IGBT during turnoff under unclamped inductive loading conditions
-
C. C. Shen, A. R. Hefner Jr., D. W. Berning, J. B. Bernstein: "Failure dynamics of the IGBT during turnoff under unclamped inductive loading conditions", IEEE Transactions on Industry Applications, Vol. 36, no 2, pp. 614-624, 2000.
-
(2000)
IEEE Transactions on Industry Applications
, vol.36
, Issue.2
, pp. 614-624
-
-
Shen, C.C.1
Hefner Jr., A.R.2
Berning, D.W.3
Bernstein, J.B.4
-
17
-
-
0003569807
-
-
Second Edition, J. Wiley & Sons, Inc
-
N. Mohan, T. M. Undeland, W. P. Robbins: Power Electronics: Converters, Applications and Design, Second Edition, J. Wiley & Sons, Inc., 1995.
-
(1995)
Power Electronics: Converters, Applications and Design
-
-
Mohan, N.1
Undeland, T.M.2
Robbins, W.P.3
-
19
-
-
0001907851
-
Improvement of the diode characteristics using Emitter-Controled Principles (EmCon Diode)
-
Weimar, Germany, May, pp
-
A. Porst, F. Auerbach, H. Brunner, G. Deboy, F. Hille: "Improvement of the diode characteristics using Emitter-Controled Principles (EmCon Diode)", in Proc. ISPSD 1997, Weimar, Germany, May, pp. 26-29.
-
(1997)
Proc. ISPSD
, pp. 26-29
-
-
Porst, A.1
Auerbach, F.2
Brunner, H.3
Deboy, G.4
Hille, F.5
-
20
-
-
0036049674
-
Investigations on the stability of dynamic avalanche in IGBTs
-
Santa Fe, USA, June, pp
-
P. Rose, D. Silber, A. Porst, F. Pfirsch: "Investigations on the stability of dynamic avalanche in IGBTs", in Proc. ISPSD 2002, Santa Fe, USA, June, pp. 165-168.
-
(2002)
Proc. ISPSD
, pp. 165-168
-
-
Rose, P.1
Silber, D.2
Porst, A.3
Pfirsch, F.4
-
21
-
-
0035272707
-
Freewheeling diode reverse-recovery failure modes in IGBT applications
-
M. T. Rahimo, N. Y. A. Shammas: "Freewheeling diode reverse-recovery failure modes in IGBT applications", IEEE Transactions on Industry Applications, Vol.37, no. 2, pp. 661-670, 2001.
-
(2001)
IEEE Transactions on Industry Applications
, vol.37
, Issue.2
, pp. 661-670
-
-
Rahimo, M.T.1
Shammas, N.Y.A.2
-
22
-
-
34548810304
-
Robustness tests and failure analysis of IGBT modules during turn-off
-
J. Urresti-Ibañez, A. Castellazzi, M. Piton, J. Rebollo, M. Mermet-Guyennet, M. Ciappa: "Robustness tests and failure analysis of IGBT modules during turn-off", Microelectronics Reliability, pp. 1754-1759, 2007.
-
(2007)
Microelectronics Reliability
, pp. 1754-1759
-
-
Urresti-Ibañez, J.1
Castellazzi, A.2
Piton, M.3
Rebollo, J.4
Mermet-Guyennet, M.5
Ciappa, M.6
-
23
-
-
50249184519
-
IGBT module failure analysis in railway applications
-
X. Perpiñà, J.F. Serviere, X. Jordà, A. Fauquet, S. Hidalgo, J. Urresti-Ibañez, J. Rebollo, M. Mermet-Guyennet: "IGBT module failure analysis in railway applications", Microelectronics Reliability, pp. 1427-1431, 2008.
-
(2008)
Microelectronics Reliability
, pp. 1427-1431
-
-
Perpiñà, X.1
Serviere, J.F.2
Jordà, X.3
Fauquet, A.4
Hidalgo, S.5
Urresti-Ibañez, J.6
Rebollo, J.7
Mermet-Guyennet, M.8
-
24
-
-
72949100224
-
-
TCAD TOOL Suite. http://www.synopsys.com/products/tcad/tcad.html. Synopsys, 2006.
-
(2006)
-
-
Suite, T.T.1
|