Failure dynamics of the IGBT during turn-off for unclamped inductive loading conditions

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1998, Pages 831-839

  Shen, Chih Chieh ^a   Hefner Jr , Allen R ^a   Berning, David W ^a   Bernstein, Joseph B ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; FAILURE ANALYSIS; GATES (TRANSISTOR); NONDESTRUCTIVE EXAMINATION; SEMICONDUCTOR DEVICE TESTING; SWITCHING CIRCUITS; THERMAL EFFECTS; WAVEFORM ANALYSIS;

INSULATED GATE BIPOLAR TRANSISTORS (IGBT); REVERSE BIAS SAFE OPERATING AREA (RBSOA) TEST SYSTEM; UNCLAMPED INDUCTIVE SWITCHING (UIS);

BIPOLAR TRANSISTORS;

EID: 0032315915     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)