Prognostics and health management of electronics

IEEE Transactions on Components and Packaging Technologies

Volumn 29, Issue 1, 2006, Pages 222-229

  Vichare, Nikhil M ^a   Pecht, Michael G ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Built in test (BIT); Prognostics and health management (PHM)

Indexed keywords

ELECTRIC FUSES; FAILURE (MECHANICAL); HEALTH CARE; LIFE CYCLE; MANAGEMENT; RELIABILITY;

CANARY DEVICES; CATASTROPHIC FAILURE; ELECTRONIC SYSTEMS; ELECTRONICS PROGNOSTICS; HEALTH MANAGEMENT; HEALTH MONITORING; SYSTEM RELIABILITY;

BUILT-IN SELF TEST;

EID: 33644792723     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2006.870387     Document Type: Article

References (63)

1. C. T. Leonard and M. G. Pecht, "Improved techniques for cost effective electronics," in Proc. Reliability Maintainability Symp., Jan. 29-31, 1991, pp. 174-182.
2. M. Karyagina, "Designing for fault-tolerance in the commercial environment," in Proc. Reliability Maintainability Symp., Jan. 22-25, 1996, pp. 258-262.
3. A. A. Shapiro, S. X. Ling, S. Ganesan, R. S. Cozy, D. J. Hunter, D. V. Schatzel, M. M. Mojarradi, and E. A. Kolawa, "Electronic packaging for extended mars surface missions," in Proc. IEEE Aerospace Conf., vol. 4, Mar. 6-13, 2004, pp. 2515-2527.
4. I. Tumer and A. Bajwa, "A survey of aircraft engine health monitoring systems," in Proc. AIAA, 1999, pp. 1-6.
5. E. P. Carden and P. Fanning, "Vibration based condition monitoring: A review," J. Struct. Health Monitoring, vol. 3, no. 4, pp. 355-377, 2004.
6. P. Chang, A. Flatau, and S. Liu, "Review paper: Health monitoring of civil infrastructure," J. Struct. Health Monitoring, vol. 3, no. 3, pp. 257-267, 2003.
7. M. Krok and K. Goebel, "Prognostics for advanced compressor health monitoring," in Proc. SPIE, vol. 5107, 2003, pp. 1-12.
8. G. J. Kacprzynski, M. J. Roemer, G. Modgil, and A. Palladino, "Enhancement of physics of failure prognostic models with system level features," in Proc. IEEE Aerospace Conf., vol. 6, 2002, pp. 2919-2925.
9. J. Xie and M. Pecht, "Application of in-situ health monitoring and prognostic sensors," in Proc. 9th Pan Pacific Microelectron. Symp. Exhibits Conf., Oahu, HI, Feb. 10-12, 2004.
10. N. Vichare, P. Rodgers, V. Eveloy, and M. G. Pecht, "Monitoring environment and usage of electronic products for health assessment and product design," in Proc. IEEE Workshop Accelerated Stress Testing Reliability (ASTR), Austin, TX, Oct. 2-5, 2005.
11. Condition Based Maintenance Plus (2005). [Online]. Available: http:// www.acq.osd.mil/log/mppr/CBM%2B.htm
12. Department of Defense, Performance Based Logistics: DoD 5000.2 Policy Document. Washington, DC: Defense Acquisition Guidebook, Dec. 2004, ch. 5.3.
13. D. Cutter and O. Thompson, "Condition-Based Maintenance Plus Select Program Survey," Tech. Rep. LG301T6, http://www.acq.osd.mil/log/mppr/CBM%2B.htm, Jan., Oct. 2005.
14. L. V. Kirkland, T. Pombo, K. Nelson, and F. Berghout, "Avionics health management: Searching for the prognostics grail," in Proc. IEEE Aerospace Conf., vol. 5, Mar. 6-13, 2004, pp. 3448-3454.
15. R. Drees and N. Young, "Role of BIT in support system maintenance and availability," IEEEA&E Syst. Mag., vol. 19, no. 8, pp. 3-7, Aug. 2004.
16. M. Pecht, M. Dube, M. Natishan, and I. Knowles, "An evaluation of built-in test," IEEE Trans. Aerosp. Electron. Syst., vol. 37, no. 1, pp. 266-272, Jan. 2001.
17. Motorola Built-In Test Diagnostic Software (2002). [Online]. Available: http://www.dot21rts.com/products/mbit%20datasheet.pdf
18. S. P. Broadwater, T. A. Oblak, and L. J. Popyack, "Maintenance processor/time stress measurement device (MP/TSMD) use for failure trend analysis," in Proc. Annu. Reliability Maintainability Symp., 1992, pp. 228-38.
19. S. P. Broadwater and E. A. Cockey, "Time stress measurement device use for on-board diagnostic support," in Proc. IEEE AUTOTESTCON'93, Sep. 1993, pp. 251-8.
20. D. Johnson, "Review of fault management techniques used in safety critical avionic systems," Progr. Aerosp. Sci., vol. 32, no. 5, pp. 415-431, Oct. 1996.
21. D. Allen, "Probabilities associated with a built-in-test system, focus on false alarms," in Proc. IEEE Systems Readiness Technology Conf. (AUTOTESTCON), Sep. 22-25, 2003, pp. 643-645.
22. R. X. Gao and A. Suryavanshi, "BIT for intelligent system design and condition monitoring," IEEE Trans. Instrum. Meas., vol. 51, no. 5, pp. 1061-1067, Oct. 2002.
23. D. Rosenthal and B. Wadell, "Predicting and eliminating built-in test false alarms," IEEE Trans. Rel., vol. 39, no. 4, pp. 500-505, Oct. 1990.
24. R. Williams, J. Banner, I. Knowles, M. Natishan, and M. Pecht, "An investigation of 'cannot duplicate' failure," Qual. Rel. Eng. Int., vol. 14, pp. 331-337, 1998.
25. A. Ramakrishnan, T. Syrus, and M. Pecht, Eds., Avionics Handbook. Boca Raton, FL: CRC, Dec. 2000, pp. 22-1-22-21.
26. S. Mishra and M. Pecht, "In-situ sensors for product reliability monitoring," in Proc. SPIE, vol. 4755, 2002, pp. 10-19.
27. "Hot Carrier (HC) Prognostic Cell," Ridgetop Semiconductor-Sentinel Silicon™ Library, Aug. 2004.
28. N. Anderson and R. Wilcoxon, "Framework for prognostics of electronic systems," in Proc. Int. Military Aerospace/Avionics COTS Conf., Seattle, WA, Aug. 3-5, 2004.
29. S. Ganesan, V. Eveloy, D. Das, and M. G. Pecht, "Identification and utilization of failure mechanisms to enhance FMEA and FMECA," in Proc. IEEE Workshop Accelerated Stress Testing Reliability (ASTR), Austin, Texas, Oct. 3-5, 2005.
30. F. Born and R. A. Boenning, "Marginal checking - A technique to detect incipient failures," in Proc. IEEE Aerospace Electron. Conf., May 22-26, 1989, pp. 1880-1886.
31. M. G. Pecht, R. Radojcic, and G. Rao, Guidebook for Managing Silicon Chip Reliability. Boca Raton, FL. CRC, 1999.
32. P. A. Smith and D. V. Campbell, "Practical implementation of BICS for safety-critical applications," in Proc. IEEE Int. Workshop Current Defect Based Testing (DBT'00), Apr. 30, 2000, pp. 51-56.
33. I. Pecuh, M. Margala, and V. Stopjakova, "1.5 Volts iddq/iddt current monitor," in Proc. IEEE Can. Conf. Elect. Comput. Eng., vol. 1, May 9-12, 1999, pp. 472-476.
34. B. Xue and D. M. H. Walker, "Built-in current sensor for IDDQ test," in Proc. IEEE Int. Workshop Current Defect Based Testing (DBT'04), Apr. 25, 2004, pp. 3-9.
35. R. G. Wright and L. V. Kirkland, "Nano-scaled electrical sensor devices for integrated circuit diagnostics," in Proc. IEEE Aerospace Conf., vol. 6, Mar. 8-15, 2003, pp. 2549-2555.
36. R. G. Wright, M. Zgol, D. Adebimpe, and L. V. Kirkland, "Functional circuit board testing using nanoscale sensors," in Proc. IEEE Systems Readiness Technology Conf. (AUTOTESTCON'03), Sep. 22-25, 2003, pp. 266-272.
37. R. G. Wright, M. Zgol, S. Keeton, and L. V. Kirkland, "Nanotechnology-based molecular test equipment (MTE)," IEEE Aerosp. Electron. Syst. Mag., vol. 16, no. 6, pp. 15-19, Jun. 2001.
38. M. S. Kanniche and M. R. Mamat-Ibrahim, "Wavelet based fuzzy algorithm for condition monitoring of voltage source inverters," Electron. Lett., vol. 40, no. 4, Feb. 2004.
39. P. Lall, N. Islam, K. Rahim, J. Suhling, and S. Gale, "Leading indicators-of-failure for prognosis of electronic and MEMS packaging," in Proc. Electron. Comp. Technol. Conf., Las Vegas, NV, Jun. 1-4, 2004, pp. 1570-1578.
40. P. Lall, N. Islam, and J. Suhling, "Prognostication and health monitoring of leaded and lead free electronic and MEMS packages in harsh environments," in Proc. 55th IEEE Electron. Comp. Technol. Conf., Orlando, FL, Jun. 1-3, 2005, pp. 1305-1313.
41. Self-Monitoring Analysis and Reporting Technology (SMART) (2005). [Online]. Available: http://www.pcguide.com/ref/hdd/perf/qual/ featuresSMART-c.html
42. G. F. Hughes, J. F. Murray, K. Kreutz-Delgado, and C. Elkan, "Improved disk-drive failure warnings," IEEE Trans. Rel., vol. 51, no. 3, pp. 350-357, Sep. 2002.
43. K. Gross, "Continuous System Telemetry Harness," Tech. Rep., [Online] Available: research.sun.con/sunlabsday/docs.2004/talks/ 1.03_Gross.pdf, 2005.
44. K. Whisnant, K. Gross, and N. Lingurovska, "Proactive fault monitoring in enterprise servers," in Proc. IEEE Int. Multiconf. Comput. Sci. Comput. Eng., Las Vegas, NV, Jun. 2005.
45. K. Mishra and K. C. Gross, "Dynamic stimulation tool for improved performance modeling and resource provisioning of enterprise servers," in Proc. 14th IEEE Int. Symp. Software Reliability Eng. (ISSRE'03), Denver, CO, Nov. 2003.
46. K. Cassidy, K. C. Gross, and A. Malekpour, "Advanced pattern recognition for detection of complex software aging phenomena in online transaction processing servers," in Proc. Int. Performance Dependability Symp., Washington, DC, Jun. 23-26, 2002.
47. K. Vaidyanathan and K. C. Gross, "MSET performance optimization for detection of software aging," in Proc. 14th IEEE Int. Symp. Software Reliability Eng. (ISSRE'03), Denver, CO, Nov. 2003.
48. D. Brown, P. Kalgren, C. Byington, and R. Orsagh, "Electronic prognostics - A case study using global positioning system (GPS)," Proc. IEEE AUTOTESTCON'05 Conf., Sep. 2005.
49. A. Ramakrishnan and M. Pecht, "A life consumption monitoring methodology for electronic systems," IEEE Trans. Comp. Packag. Technol., vol. 26, no. 3, pp. 625-634, Sep. 2003.
50. S. Mishra, M. Pecht, T. Smith, I. McNee, and R. Harris, "Remaining life prediction of electronic products using life consumption monitoring approach," in Proc. Eur. Microelectron. Packag. Interconnection Symp., Cracow, Poland, Jun. 16-18, 2002, pp. 136-142.
51. S. Mathew, D. Das, M. Osterman, M. G. Pecht, and R. Ferebee, "Prognostic assessment of aluminum support structure on a printed circuit board," ASME J. Electron. Packag., to be published.
52. V. Shetty, D. Das, M. Pecht, D. Hiemstra, and S. Martin, "Remaining life assessment of shuttle remote manipulator system end effector," in Proc. 22nd Space Simulation Conf., Ellicott City, MD, Oct. 21-23, 2002.
53. N. Harchani, F. Jimenez, M. Almohamed, D. Esteve, and M. Courvoisier, "Time stress measurement device: System design and synthesis," in Proc. SPIE, vol. 4051, 2000, pp. 337-48.
54. V. Rouet and B. Foucher, "Development and use of a miniaturized health monitoring device," in Proc. IEEE Int. Reliability Phys. Symp., 2004, pp. 645-6.
55. D. Searls, T. Dishongh, and P. Dujari. "A Strategy for enabling data driven product decisions through a comprehensive understanding of the usage environment," in Proc. IPACK'01, Kauai, HI, Jul. 8-13, 2001, pp. 1279-1274.
56. G. Herbst, "IBM's Drive Temperature Indicator Processor (drive-TIP) Helps Ensure High Drive Reliability," Tech Rep., IBM, [Online] Available: www.hc.kz/pdf/drivetemp.pdf, Sep. 2005.
57. N. Vichare, P. Rodgers, V. Eveloy, and M. G. Pecht, "In-situ temperature measurement of a notebook computer - A case study in health and usage monitoring of electronics," IEEE Trans. Device Mater. Rel., vol. 4, no. 4, pp. 658-663, Dec. 2004.
58. K. Bodenhoefer, "Environmental life cycle information management and acquisition - First experiences and results from field trials," in Proc. Electron. Goes Green 2004+, Berlin, Germany, Sep. 5-8, 2004, pp. 541-546.
59. D-19 Final Report on ELIMA Prospects and Wider Potential for Exploitation (2005). [Online]. Available: www.ELIMA.org
60. V. A. Skormin, V. I. Gorodetski, and L. J. Popyack, "Data mining technology for failure prognostic of avionics," IEEE Trans. Aerosp. Electron. Syst., vol. 38, no. 2, pp. 388-403, Apr. 2002.
61. S. Mishra, S. Ganesan, M. Pecht, and J. Xie, "Life consumption monitoring for electronics prognostics," in Proc. IEEE Aerospace Conf., vol. 5, Mar. 6-13, 2004, pp. 3455-3467.
62. R. Orsagh, D. Brown, M. Roemer, T. Dabney, and A. Hess, "Prognostic health management for avionics power supplies," in Proc. IEEE Aerospace Conf., Mar. 2005, pp. 1-7.
63. D. Goodman, B. Vermeire, P. Spuhler, and H. Venkatramani, "Practical application of PHM/prognostics to COTS power converters," in Proc. IEEE Aerospace Conf., Big Sky, MT, Mar. 5-12, 2005, pp. 1-6.