Lifetime prediction of IGBT modules for traction applications

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 2000, Pages 210-216

  Ciappa, Mauro ^a   Fichtner, Wolfgang ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; ELECTRIC CONVERTERS; ELECTRIC CURRENTS; ELECTRIC RAILROADS; ELECTRIC TRACTION; FATIGUE OF MATERIALS; MATHEMATICAL MODELS; THERMAL CYCLING;

BOND WIRE LIFT-OFF; INSULATED GATE BIPOLAR TRANSISTORS (IGBT);

MULTICHIP MODULES;

EID: 0033732440     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)