MOSFET gate open failure analysis in power electronics

Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Volumn , Issue , 2013, Pages 189-196

  Delepaut, Christophe ^a   Siconolfi, Sara ^a   Mourra, Olivier ^a   Tonicello, Ferdinando ^a  

^a EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPONENT LEVELS; CONVERTER DESIGN; FAULT TOLERANT OPERATIONS; GATE-OPEN FAILURES; PRACTICAL TESTS; SOURCE CHANNELS; THERMAL FAILURE; THERMAL INSTABILITIES;

MOSFET DEVICES;

POWER ELECTRONICS;

EID: 84879366461     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEC.2013.6520206     Document Type: Conference Paper

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