Imaging and manipulation of the Si(100) surface by small-amplitude NC-AFM at zero and very low applied bias

Journal of Physics Condensed Matter

Volumn 24, Issue 8, 2012, Pages

  Sweetman, A ^a   Danza, R ^a   Gangopadhyay, S ^a   Moriarty, P ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; ATOMIC FORCE MICROSCOPES; NON-CONTACT; SI(100) SURFACE; TUNNEL CURRENTS;

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; SILICON;

SURFACE DEFECTS;

EID: 84857214323     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/24/8/084009     Document Type: Article

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