Split-off dimer defects on the Si(001)2X1 surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 8, 2004, Pages 853121-853128

  Schofield, S R ^a   Curson, N J ^a   O'Brien, J L ^a,d   Simmons, M Y ^a   Clark, R G ^a   Marks, N A ^b   Wilson, H F ^b   Brown, G W ^c   Hawley, M E ^c  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

DIMER; SILICON;

ARTICLE; CALCULATION; DENSITY; DIMERIZATION; SCANNING TUNNELING MICROSCOPY;

EID: 1842459360     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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