Imaging charged defects on clean Si(100)-(2×1) with scanning tunneling microscopy

Journal of Applied Physics

Volumn 92, Issue 2, 2002, Pages 820-824

  Brown, G W ^a   Grube, H ^a   Hawley, M E ^a   Schofield, S R ^b   Curson, N J ^b   Simmons, M Y ^b   Clark, R G ^b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BANDBENDING; CHARGED DEFECTS; II-IV SEMICONDUCTORS; N-TYPE MATERIALS; P-TYPE; PERIODIC SURFACES; SI(1 0 0); STATE DENSITIES; STM IMAGES; STM STUDY; TUNNELING CURRENT;

CRYSTAL IMPURITIES; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES;

SURFACE DEFECTS;

EID: 0037100953     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1486047     Document Type: Article

References (10)

1. R. J. Hamers and U. K. Kohler, J. Vac. Sci. Technol. A 7, 2854 (1989). jva JVTAD6 0734-2101
2. P. Ebert, Surf. Sci. Rep. 33, 121 (1999). ssr SSREDI 0167-5729
3. G. Lengel, R. Wilkins, G. Brown, M. Weimer, J. Gryko, and R. E. Allen, Phys. Rev. Lett. 72, 836 (1994). prl PRLTAO 0031-9007
4. P. Ebert, M. Heinrich, M. Simon, C. Domke, K. Urban, C. K. Shih, M. B. Webb, and M. G. Lagally, Phys. Rev. B 53, 4580 (1996). prb PRBMDO 0163-1829
5. V. A. Ukraintsev, Z. Dohnalek, and J. T. Yates, Jr., Surf. Sci. 388, 132 (1997). sus SUSCAS 0039-6028
6. M. McEllistrem, G. Haase, D. Chen, and R. J. Hamers, Phys. Rev. Lett. 70, 2471 (1993). prl PRLTAO 0031-9007
7. M. Chander, Y. Z. Li, J. C. Patrin, and J. H. Weaver, Phys. Rev. B 48, 2493 (1993). prb PRBMDO 0163-1829
8. J. H. G. Owen, D. R. Bowler, C. M. Goringe, K. Miki, and G. A. D. Briggs, Surf. Sci. 341, L1042 (1995). sus SUSCAS 0039-6028
9. V. A. Ukraintsev and J. T. Yates, Jr., Surf. Sci. 346, 31 (1996). sus SUSCAS 0039-6028
10. L. Lequn, J. Yu, and J. W. Lyding, Appl. Phys. Lett. 78, 386 (2001). apl APPLAB 0003-6951