Dynamics of an ising chain under local excitation: A scanning tunneling microscopy study of Si(100) dimer rows at 5K

Physical Review Letters

Volumn 96, Issue 2, 2006, Pages

  Pennec, Y ^a   Horn Von Hoegen, M ^b   Zhu, Xiaobin ^a   Fortin, D C ^a   Freeman, M R ^a,c  

^a UNIVERSITY OF ALBERTA   (Canada)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELEMENTARY PARTICLE SOURCES; LOW TEMPERATURE EFFECTS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE PROPERTIES; TUNNEL JUNCTIONS;

PHASONS; SI DIMER; SPIN-FLIP EXCITATIONS;

DIMERS;

EID: 32644472072     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.026102     Document Type: Article

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