Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 301-305

  Özer, H Özgür ^a   Atabak, Mehrdad ^a   Ellialtǧlu, Recai M ^a   Oral, Ahmet ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

Force distance spectroscopy; Non contact atomic force microscopy; Short range forces; Si(1 0 0)(2 1); Small oscillation amplitudes

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY; SURFACES;

OSCILLATION AMPLITUDES;

SEMICONDUCTING SILICON;

EID: 0037187204     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00942-4     Document Type: Conference Paper

References (8)