Influence of tip-surface interactions and surface defects on Si(100) surface structures by low-temperature (5 K) scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 12, 2004, Pages

  Riedel, D ^a   Lastapis, M ^a   Martin, M G ^a   Dujardin, G ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ANALYTIC METHOD; ARTICLE; ARTIFACT; LOW TEMPERATURE PROCEDURES; MOLECULAR INTERACTION; QUANTITATIVE ANALYSIS; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; VACUUM;

EID: 2342439445     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.121301     Document Type: Article

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