Simultaneous force and current mapping of the Si (111) - (7×7) surface by dynamic force microscopy

Applied Physics Letters

Volumn 96, Issue 26, 2010, Pages

  Sugimoto, Yoshiaki ^a   Yi, Insook ^a,b   Morita, Ken Ichi ^a   Abe, Masayuki ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

^b Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDINGS; CONDUCTIVE TIPS; CURRENT MAPPING; DYNAMIC FORCE MICROSCOPY; INTERACTION FORCES; PEAK VALUES; SI (1 1 1); SPATIAL MAPS; SURFACE ATOMS; THEORETICAL SIMULATION; TOPOGRAPHIC PROFILES;

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS;

SCANNING TUNNELING MICROSCOPY;

EID: 77954347439     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3457997     Document Type: Article

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