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Volumn 76, Issue 6-8, 2004, Pages 147-162

Ground state of the Si(0 0 1) surface revisited - Is seeing believing?

Author keywords

AFM; Germanium; LEED; Low temperature; PES; Silicon; STM; Surface structure

Indexed keywords

ELECTRON DIFFRACTION; GROUND STATE; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY;

EID: 4644324675     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.progsurf.2004.05.015     Document Type: Review
Times cited : (49)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.