Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atoms

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 8, 2011, Pages

  Sweetman, A ^a   Jarvis, S ^a   Danza, R ^a   Bamidele, J ^b   Kantorovich, L ^b   Moriarty, P ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80052443662     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.085426     Document Type: Article

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