NC-AFM imaging of the TiO2(110)-(1 × 1) surface at low temperature

Nanotechnology

Volumn 21, Issue 16, 2010, Pages

  Yurtsever, A ^a   Sugimoto, Y ^a   Abe, M ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; AFM IMAGING; ATOMIC ROWS; BRIDGING OXYGEN; CONTRAST MODES; DISSIPATION MEASUREMENTS; HIDDEN MODES; HIGH RESOLUTION IMAGE; IMAGE CONTRASTS; IMPURITY DEFECTS; IN-PLANE; LOW TEMPERATURES; NONCONTACT ATOMIC FORCE MICROSCOPY; OH GROUP; OXYGEN ATOM; REPULSIVE FORCES; TIO; TIP APEX; TIP-INDUCED; TIP-SAMPLE DISTANCE;

ATOMIC FORCE MICROSCOPY; IMAGE RECORDING; OXYGEN; SURFACE DEFECTS;

ATOMS;

NANOMATERIAL; TITANIUM; TITANIUM DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; TEMPERATURE; ULTRASTRUCTURE;

MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES; TEMPERATURE; TITANIUM;

EID: 77950509351     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/16/165702     Document Type: Article

References (34)

1. Morita S, Wiesendanger R and Meyer E (ed) 2002 Noncontact Atomic Force Microscopy (Berlin: Springer)
2. Garcia R and Perez R 2002 Surf. Sci. Rep. 47 197
3. Giessibl F J 2003 Rev. Mod. Phys. 75 949
4. Diebold U 2003 Surf. Sci. Rep. 48 53
5. Henrich V E and Cox P A 1994 The Surface Science of Metal Oxides (Cambridge: Cambridge University Press)
6. Diebold U, Anderson J F, Ng K-O and Vanderbilt D 1996 Phys. Rev. Lett. 77 1322
7. Pang C L, Sasahara A, Onishi H, Chen Q and Thornton G 2006 Phys. Rev. B 74 073411
8. Pang C L, Muryn C A, Woodhead A P, Raza H, Haycock S A, Dhanak V R and Thornton G 2005 Surf. Sci. 583 L147
9. Bechstein R, Kitta M, Schutte J, Onishi H and Kuhnle A 2009 Nanotechnology 20 264003
10. Diebold U, Lehman J, Mahmoud T, Kuhn M, Leonardelli G, Hebenstreit W, Schmid M and Varga P 1998 Surf. Sci. 411 137
11. Enevoldsen G H, Foster A S, Christensen M C, Lauritsen J V and Besenbacher F 2007 Phys. Rev. B 76 205415
12. Pang C L, Lindsay R and Thornton G 2008 Chem. Soc. Rev. 37 2328
13. Lauritsen J V, et al. 2006 Nanotechnology 17 3436
14. Enevoldsen G H, Pinto H P, Foster A S, Jensen M C R, Kuhnle A, Reichling M, Hofer W A, Lauritsen J V and Besenbacher F 2008 Phys. Rev. B 78 045416
15. Suzuki S, Fukui K-i, Onishi H and Iwasawa Y 2000 Phys. Rev. Lett. 84 2156
16. Cui X F, Wang Z, Tan S J, Wang B, Yang J L and Hou J G 2009 J. Phys. Chem. C 113 13204
17. Enevoldsen G H, Pinto H P, Foster A S, Jensen M C R, Hofer W A, Hammer B, Lauritsen J V and Besenbacher F 2009 Phys. Rev. Lett. 102 136103
18. Suehira N, Tomiyoshi Y, Sugawara Y and Morita S 2001 Rev. Sci. Instrum. 72 2971
19. Albrecht T R, Grütter P, Horne D and Rugar D 1991 J. Appl. Phys. 69 668
20. Wendt S, et al. 2005 Surf. Sci. 598 226
21. Abe M, Sugimoto Y, Custance O and Morita S 2005 Nanotechnology 16 3029
22. Foster A S, Gal A Y, Nieminen R M and Shluger A L 2005 J. Phys. Chem. B 109 4554
23. Bechstein R, Gonzalez C, Schutte J, Jelinek P, Perez R and Kuhnle A 2009 Nanotechnology 20 505703
24. Fukui K-i, Onishi H and Iwasawa Y 1997 Phys. Rev. Lett. 79 4202
25. Wendt S, Matthiesen J, Schaub R, Vestergaard E K, Laegsgaard E, Besenbacher F and Hammer B 2006 Phys. Rev. Lett. 96 066107
26. Li S C, Zhang Z, Sheppard D, Kay B D, White J M, Du Y, Lyubinetsky I, Henkelman G and Dohnalek Z 2008 J. Am. Chem. Soc. 130 9080
27. Sugimoto Y, Jelinek P, Pou P, Abe M, Morita S, Perez R and Custance O 2007 Phys. Rev. Lett. 98 106104
28. Enevoldsen G H, Glatzel T, Christensen M C, Lauritsen J V and Besenbacher F 2008 Phys. Rev. Lett. 100 236104
29. Hoffmann R, Baratoff A, Hug H J, Hidber H R, von Lohneysen H and Guntherodt H J G 2007 Nanotechnology 18 395503
30. Xu C, Lai X, Zajac G W and Goodman D W 1997 Phys. Rev. B 56 13464
31. Liu L M, Crawford P and Hu P 2009 Prog. Surf. Sci. 84 155
32. Oyabu N, Pou P, Sugimoto Y, Jelinek P, Abe M, Morita S, Perez R and Custance O 2006 Phys. Rev. Lett. 96 106101
33. Sasaki N and Tsukada M 2000 Japan. J. Appl. Phys. 2 39 L1334
34. Park S-i, Nogami J and Quate C F 1987 Phys. Rev. B 36 2863