QPlus atomic force microscopy of the Si(100) surface: Buckled, split-off, and added dimers

Applied Physics Letters

Volumn 95, Issue 6, 2009, Pages

  Sweetman, A ^a   Gangopadhyay, S ^a   Danza, R ^a   Berdunov, N ^a   Moriarty, P ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT TYPE; DIMER CONFIGURATION; FREQUENCY SHIFT; NONCONTACT ATOMIC FORCE MICROSCOPY; OSCILLATION AMPLITUDE; PEAK-TO-PEAK-; PRISTINE SURFACES; SET-POINT; SI(100) SURFACE; STRUCTURAL MODELS;

ATOMIC FORCE MICROSCOPY; ATOMS; IMAGE RECONSTRUCTION; MODEL STRUCTURES;

DIMERS;

EID: 69049116280     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3197595     Document Type: Article

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