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Volumn 84, Issue 7, 2011, Pages

Effect of charged dislocation scattering on electrical and electrothermal transport in n-type InN

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EID: 80052481853     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.075315     Document Type: Article
Times cited : (70)

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