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Volumn 192, Issue 2, 2002, Pages 407-411
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Determination by electron holography of the electronic charge distribution at threading dislocations in epitaxial GaN
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
DISLOCATIONS (CRYSTALS);
ELECTRON HOLOGRAPHY;
ELECTRONIC PROPERTIES;
ELECTROSTATICS;
MOLECULAR BEAM EPITAXY;
THREADING DISLOCATIONS;
GALLIUM NITRIDE;
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EID: 0036670894
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(200208)192:2<407::AID-PSSA407>3.0.CO;2-M Document Type: Conference Paper |
Times cited : (47)
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References (14)
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