Small-amplitude dynamic force microscopy using a quartz cantilever with an optical interferometer

Nanotechnology

Volumn 21, Issue 30, 2010, Pages

  Morita, K ^a   Sugimoto, Y ^a   Sasagawa, Y ^a   Abe, M ^a   Morita, S ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE DYNAMICS; BLUNT TIP; COVALENT BONDING; DEFLECTION SENSORS; DYNAMIC FORCE MICROSCOPY; FORCE SENSITIVITY; FORCE SPECTROSCOPY; HIGH STIFFNESS; LOW NOISE; NOISE FLOOR; OPTICAL INTERFEROMETER; OSCILLATION AMPLITUDE; QUARTZ CANTILEVER; ROOM TEMPERATURE; SHORT-RANGE FORCES; SI (1 1 1); SIMULTANEOUS MEASUREMENT; TOPOGRAPHIC IMAGES; TUNNELING CURRENT;

ATOMIC FORCE MICROSCOPY; INTERFEROMETERS; NANOCANTILEVERS; OXIDE MINERALS; VAN DER WAALS FORCES;

QUARTZ;

EID: 77954414403     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/30/305704     Document Type: Article

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