New views of materials through aberration-corrected scanning transmission electron microscopy

Journal of Electron Microscopy

Volumn 60, Issue SUPPL. 1, 2011, Pages

  Pennycook, S J ^a   Varela, M ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

aberration correction; electron energy loss spectroscopy; scanning transmission electron microscopy; Z contrast

Indexed keywords

DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; ELECTRON ENERGY-LOSS SPECTROSCOPIES; HIGH CURRENTS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTRUM IMAGING; THIRD ORDER; TWO-DIMENSIONAL SPECTRA; Z CONTRASTS;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 80052063699     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfr030     Document Type: Review

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