Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy

Ultramicroscopy

Volumn 110, Issue 7, 2010, Pages 778-782

  Kimoto, Koji ^a   Asaka, Toru ^b   Yu, Xiuzhen ^a   Nagai, Takuro ^a   Matsui, Yoshio ^a   Ishizuka, Kazuo ^a,c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN FINE CERAMICS CENTER   (Japan)

^c Higashimatsuyama   (Japan)

Author keywords

Annular dark field imaging; Crystal structure analysis; Scanning transmission electron microscopy

Indexed keywords

ATOM POSITIONS; CRYSTAL STRUCTURE ANALYSIS; DARK FIELD IMAGING; DARK-FIELD; DEFOCUS; DIRECT OBSERVATION; EXPERIMENTAL PARAMETERS; HIGH PRECISION; IMAGE CONTRASTS; IMAGE DISTORTIONS; INCOHERENT IMAGING; PROCESSING TECHNIQUE; RESOLUTION ENHANCEMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERING OBJECTS; SOFTWARE-BASED; STRUCTURE IMAGE;

CONVOLUTION; DATA PROCESSING; ELECTRIC FIELD MEASUREMENT; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INCOHERENT SCATTERING; POSITION MEASUREMENT; SCANNING; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO;

CRYSTAL STRUCTURE;

ACCURACY; ARTICLE; CRYSTAL STRUCTURE; DATA ANALYSIS SOFTWARE; ENTROPY; IMAGE ANALYSIS; INFORMATION PROCESSING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL NOISE RATIO; STRUCTURE ANALYSIS;

EID: 77953541681     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.11.014     Document Type: Article

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