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Volumn , Issue 10, 2001, Pages 907-908
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Z-contrast tomography: A technique in three-dimensional nanostructural analysis based on Rutherford scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
PALLADIUM;
RUTHENIUM;
SILICON DIOXIDE;
ARTICLE;
CATALYST;
CHEMICAL STRUCTURE;
NEUTRON SCATTERING;
STRUCTURE ANALYSIS;
TECHNIQUE;
TOMOGRAPHY;
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EID: 0035926871
PISSN: 13597345
EISSN: None
Source Type: Journal
DOI: 10.1039/b101819c Document Type: Article |
Times cited : (257)
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References (14)
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