Materials characterization in the aberration-corrected scanning transmission electron microscope

Annual Review of Materials Research

Volumn 35, Issue , 2005, Pages 539-569

  Varela, M ^a   Lupini, A R ^a   Van Benthem, K ^a   Borisevich, A Y ^a   Chisholm, M F ^a   Shibata, N ^b   Abe, E ^b   Pennycook, S J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

Catalysis; Complex oxides; Electron energy loss spectroscopy; Nanotechnology; Semiconductors; Z contrast microscopy

Indexed keywords

ATOMIC RESOLUTION; COMPLEX OXIDES; RELATIVE INTENSITY;

ABERRATIONS; CATALYSIS; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGING TECHNIQUES; NANOTECHNOLOGY; SEMICONDUCTOR MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

CHARACTERIZATION;

EID: 24944460757     PISSN: 15317331     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.matsci.35.102103.090513     Document Type: Article

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